{"product_id":"scanning-probe-microscopy-atomic-force-and-scanning-tunneling","title":"Scanning Probe Microscopy: Atomic Force and Scanning Tunneling","description":"\u003cp\u003eIn this review of Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy the bottom line is clear: this textbook is a focused, practical guide for newcomers who need to operate and interpret data from scanning probe instruments. The author systematically explains both the operating principles and the technical background so a graduate student or researcher can progress from theory to hands-on use. Readers seeking a compact, application-minded reference will find the book especially useful for learning to run a microscope and understand the images and spectra it produces.\u003c\/p\u003e\n\u003ch2\u003eKey Features\u003c\/h2\u003e\n\u003cul\u003e\n\u003cli\u003e\n\u003cstrong\u003eClear operating principles:\u003c\/strong\u003e The book explains how atomic force microscopy and scanning tunneling microscopy work, helping readers grasp the fundamentals behind image formation.\u003c\/li\u003e\n\u003cli\u003e\n\u003cstrong\u003ePractical guidance:\u003c\/strong\u003e Chapters aim to enable the reader to operate a scanning probe microscope successfully, reducing the learning curve for laboratory use.\u003c\/li\u003e\n\u003cli\u003e\n\u003cstrong\u003eData interpretation:\u003c\/strong\u003e The text emphasizes how to understand and analyze the data obtained with the microscope, improving experimental outcomes.\u003c\/li\u003e\n\u003cli\u003e\n\u003cstrong\u003eTechnical context:\u003c\/strong\u003e Complementary chapters cover important technical aspects and fundamentals that support reliable instrument operation.\u003c\/li\u003e\n\u003cli\u003e\n\u003cstrong\u003eTargeted audience:\u003c\/strong\u003e Written primarily for graduate students and researchers new to the field, making it suitable as a course textbook or lab reference.\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch2\u003eWho It's For\u003c\/h2\u003e\n\u003cp\u003eThe book is ideal for graduate students in physics, materials science, chemistry, nanoscience and engineering who need a single-volume introduction to both atomic force microscopy and scanning tunneling microscopy. It suits researchers newly assigned to scanning probe techniques who require practical operating knowledge alongside theoretical background.\u003c\/p\u003e\n\u003cp\u003ePracticing microscopists seeking an exhaustive advanced reference or instrument-specific service manual should look elsewhere, as the text focuses on principles, operation and data understanding rather than detailed hardware repair procedures or model-level software tutorials.\u003c\/p\u003e\n\u003ch2\u003ePros \u0026amp; Cons\u003c\/h2\u003e\n\u003cp\u003e\u003cstrong\u003ePros\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003eConcise explanation of both AFM and STM principles that aids rapid learning for new users.\u003c\/li\u003e\n\u003cli\u003ePractical orientation that prepares readers to operate a scanning probe microscope in a lab setting.\u003c\/li\u003e\n\u003cli\u003eBalanced coverage of fundamentals and technical aspects that supports sound experimental practice.\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003e\u003cstrong\u003eCons\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003eNot a substitute for manufacturer documentation or instrument-specific software guides when troubleshooting model-level issues.\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch2\u003eSpecifications\u003c\/h2\u003e\n\u003ctable\u003e\n\u003ctr\u003e\n\u003ctd\u003eTitle\u003c\/td\u003e\n\u003ctd\u003eScanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eAuthor\u003c\/td\u003e\n\u003ctd\u003eBert Voigtlander\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eSubject\u003c\/td\u003e\n\u003ctd\u003eAtomic force microscopy and scanning tunneling microscopy principles and operation\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eIntended audience\u003c\/td\u003e\n\u003ctd\u003eGraduate students and researchers new to the field\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eFocus\u003c\/td\u003e\n\u003ctd\u003eOperating principles, data interpretation, and technical fundamentals\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\n\u003ch2\u003eOur Verdict\u003c\/h2\u003e\n\u003cp\u003eFor graduate students and early-career researchers needing a practical, theory-backed introduction to scanning probe techniques, this book is a strong value. It bridges the gap between fundamentals and hands-on operation, making it a useful textbook or lab reference that helps novices learn to run an AFM or STM and interpret their data confidently.\u003c\/p\u003e\n\u003ch2\u003eFrequently Asked Questions\u003c\/h2\u003e\n\u003cp\u003e\u003cstrong\u003eDoes this book teach how to operate specific microscope models?\u003c\/strong\u003e\u003cbr\u003eThe book focuses on general operating principles and common technical aspects rather than model-specific instructions or software tutorials.\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eIs the text suitable for chemistry and materials science students?\u003c\/strong\u003e\u003cbr\u003eYes; the author targets graduate students in physics, materials science, chemistry, nanoscience and engineering with practical and theoretical coverage.\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eWill it help with data analysis from scanning probe experiments?\u003c\/strong\u003e\u003cbr\u003eYes; one of the main goals is to enable readers to understand and interpret the data obtained with scanning probe microscopes.\u003c\/p\u003e","brand":"Bert Voigtlander","offers":[{"title":"Default Title","offer_id":48196877189339,"sku":"3662505576","price":51.67,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0724\/1043\/1707\/files\/61U-DH_EYVL._SL1254.jpg?v=1770367889","url":"https:\/\/gearmusthave.com\/products\/scanning-probe-microscopy-atomic-force-and-scanning-tunneling","provider":"GearMustHave","version":"1.0","type":"link"}