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Modeling and Characterization of RF and Microwave Power FETs

Modeling and Characterization of RF and Microwave Power FETs

Regular price $100.01 USD

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In this review of Modeling and Characterization of RF and Microwave Power FETs, the bottom line is simple: this book is an advanced, practical reference for designers and modelers of high-power RF transistors. Written by semiconductor industry professionals, the book's greatest value is its clear presentation of characterization, measurement and simulator implementation procedures that let engineers produce transistor models they can trust. For anyone working on LDMOS or III-V power amplifiers, this book provides the procedural detail and validation methods needed to move from raw device data to a usable circuit model.

Key Features

  • Comprehensive FET modeling: Presents end-to-end methods to build a transistor model, covering characterization through simulator implementation so designers can rely on consistent device behavior in circuits.
  • Measurement and characterization: Describes practical measurement techniques and data collection strategies that reduce ambiguity in extracted parameters for high-power devices.
  • Verification and validation procedures: Includes validation workflows and checks that help confirm model accuracy across bias, temperature and power ranges.
  • Technology-independent approach: Focuses on principles applicable to LDMOS and III-V technologies so readers can adapt methods to different semiconductor processes.
  • Thermal and scaling coverage: Discusses thermal effects and scaling issues that are critical when modeling power FETs for real-world RF and microwave amplifiers.
  • Industry-authored guidance: Written by experienced device modelers, offering practical insights into simulator implementation and common pitfalls.

Who It's For

This book is aimed at RF and microwave power amplifier designers, device modeling engineers and advanced graduate students who need a rigorous, practical reference for developing transistor models. It is especially useful for professionals working with LDMOS and III-V power FETs who must validate models for circuit simulation and production use.

Less suitable readers include hobbyists or beginners seeking a gentle introduction to RF fundamentals, since the text assumes familiarity with device physics and simulator workflows. Those who need quick application notes or basic amplifier tutorials should look for shorter, application-focused resources instead.

Pros & Cons

Pros

  • Thorough, end-to-end treatment of modeling from measurement to simulator implementation.
  • Practical validation and verification procedures that improve model confidence in circuit design.
  • Technology-independent discussion that supports both LDMOS and III-V workflows.
  • Authored by experienced industry professionals, reflecting real-world modeling challenges.

Cons

  • Not an introductory textbook; the material assumes prior knowledge of RF device concepts and simulation tools.

Specifications

Title Modeling and Characterization of RF and Microwave Power FETs
Series The Cambridge RF and Microwave Engineering Series
Authors Peter Aaen, Jaime A. Pla, John Wood
Focus FET modeling, characterization, measurement, validation
Technologies Covered LDMOS and III-V power FETs
Key Topics Thermal effects, scaling, simulator implementation

Our Verdict

Modeling and Characterization of RF and Microwave Power FETs is a high-value technical reference for device modelers and amplifier designers who need rigorous procedures for producing reliable transistor models. While not introductory, its practical focus on measurement, verification and simulator implementation makes it a worthy addition to the bookshelf of any engineer working with high-power RF transistors.

Frequently Asked Questions

Does this book cover specific semiconductor processes?
Answer. The text uses a technology-independent approach but explicitly addresses LDMOS and III-V device considerations and how to adapt methods across processes.

Is this suitable for beginners?
Answer. No; the book assumes familiarity with device physics and simulation tools and is best for professionals or advanced students.

Will it help with simulator implementation?
Answer. Yes; the authors include practical guidance on simulator implementation, model verification and validation procedures relevant to circuit designers.

Editor's Take

GearMustHave editorial rating: 4.2 out of 5. GearMustHave Editorial Rating

A rigorous, practical reference for device modelers and amplifier designers, offering end-to-end methods for measurement, simulator implementation and model validation for LDMOS and III-V power FETs.

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Modeling and Characterization of RF and Microwave Power FETs
Modeling and Characterization of RF and Microwave Power FETs
Regular price $100.01 USD
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